구성원

PEOPLE & LIFE

정완영

Jung, Wanyeong
사진_정완영.jpg

연구디비젼

Circuit

division

주요 연구분야

AI & Machine Learning, Robotics & Control, Computer Architecture, Software Systems & Networking, Integrated Circuits & Semiconductor Systems, Quantum Science & Engineering, Semiconductor Devices & Nanotechnology

주요 연구

초저전력 아날로그/디지털 회로 및 IoT 시스템.

소속연구실

지능형전력효율설계연구실

위치

전기및전자공학부동 (E3-2)

4201

연락처

7459

학위
University of Michigan, Ann Arbor / 2017
대표업적

Power management and energy harvesting

1. Wanyeong Jung, Sechang Oh, Suyoung Bang, Yoonmyung Lee, Zhiyoong Foo, Gyouho Kim, Yiqun Zhang, Dennis Sylvester, David Blaauw, “An Ultra-Low Power Fully Integrated Energy Harvester Based on Self-Oscillating Switched-Capacitor Voltage Doubler,” IEEE Journal of Solid-

State Circuits, vol. 49, no. 12, pp. 2800-2811, Dec. 2014. (Invited to special issue for ISSCC papers)

2. Wanyeong Jung, Junhua Gu, Paul D. Myers, Minseob Shim, Kaiyuan Yang, Myungjoon Choi, ZhiYoong Foo, Suyoung Bang, Sechang Oh, Dennis Sylvester, David Blaauw, “A 60%-efficiency 20nW-500µW tri-output fully integrated power management unit with environmental adaptation and load-proportional biasing for IoT systems,” IEEE ISSCC Dig. Tech. Papers, pp. 154-155, 2016.

3.Wanyeong Jung, Dennis Sylvester, David Blaauw, “A rational-conversion-ratio switched-capacitor DC-DC converter using negative-output feedback,” in IEEE ISSCC Dig. Tech. Papers, pp. 218-219, 2016.

 

Sensor and data converter

4. Wanyeong Jung, Seokhyeon Jeong, Sechang Oh, Dennis Sylvester, David Blaauw “A 0.7pF-to-10nF fully digital capacitance-to-digital converter using iterative delay-chain discharge,” in IEEE ISSCC Dig. Tech. Papers, pp. 484-485, 2015.

5. Minseob Shim, Seokhyeon Jeong, Paul Myers, Suyoung Bang, Junhua Shen, Chulwoo Kim, Dennis Sylvester, David Blaauw, Wanyeong Jung, “Edge-Pursuit Comparator: An Energy-Scalable Oscillator Collapse-Based Comparator With Application in a 74.1 dB SNDR and 20 kS/s 15b SAR ADC,” IEEE Journal of Solid-State Circuits, vol.52, no. 4, pp. 1077-1090, Apr. 2017 (Invited to special issue for VLSI-C papers)