{"id":107327,"date":"2010-11-19T16:39:13","date_gmt":"2010-11-19T07:39:13","guid":{"rendered":"http:\/\/175.125.95.178\/press\/7327\/"},"modified":"2026-04-18T08:07:09","modified_gmt":"2026-04-17T23:07:09","slug":"7327","status":"publish","type":"press-post","link":"http:\/\/ee.presscat.kr\/en\/presses\/7327\/","title":{"rendered":"IEEE CPMT Symposium Japan &#039;&#039;Young Award&quot;"},"content":{"rendered":"<p>Chonghyun Jo (PhD candidate, Advisor: Jungho Kim) received &lsquo;Young Award&rsquo; for his distinguished work in the IEEE CPMT Symposium Japan 2010.<\/p>\n<p>Title : Guard Ring Effect for Through Silicon Via (TSV) Noise Coupling Reduction<br \/>\n<img fetchpriority=\"high\" decoding=\"async\" height=\"288\" alt=\"\" width=\"400\" src=\"\/userfiles\/2010_09_01(2).jpg\" title=\"\"><br \/>\n<img decoding=\"async\" height=\"377\" width=\"500\" alt=\"\" src=\"\/userfiles\/2010_09_01-1(1).jpg\" title=\"\"><\/p>\n","protected":false},"excerpt":{"rendered":"<p>519<\/p>\n","protected":false},"featured_media":0,"template":"","class_list":["post-107327","press-post","type-press-post","status-publish","hentry"],"acf":[],"_links":{"self":[{"href":"http:\/\/ee.presscat.kr\/en\/wp-json\/wp\/v2\/press-post\/107327","targetHints":{"allow":["GET"]}}],"collection":[{"href":"http:\/\/ee.presscat.kr\/en\/wp-json\/wp\/v2\/press-post"}],"about":[{"href":"http:\/\/ee.presscat.kr\/en\/wp-json\/wp\/v2\/types\/press-post"}],"wp:attachment":[{"href":"http:\/\/ee.presscat.kr\/en\/wp-json\/wp\/v2\/media?parent=107327"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}